Ingmar Swart has published 37 papers in international refereed journals, 28 of which in high-ranking (Impact Factor >7) journals. These include: Nature (1), Science (1), Nature Communications (2), Chemical Reviews (1), Physical Review Letters (6), Nano Letters (6), ACS Nano (3), Journal of the American Chemical Society (3), and Angewandte Chemie (4)

The average number of citations per publication is 46. My h- and i10-index are 22 and 28, respectively.

A complete list, including citations, can be found on Google Scholar.



  • Aryl Radical Geometry Determines Nanographene Formation on Au(111), Peter H. Jacobse, Adri van den Hoogenband, Marc-Etienne Moret, Robertus J. M. Klein Gebbink, and Ingmar Swart Angewandte Chemie International Edition, in press (2016)
  • Characteristic Contrast in ∆fmin Maps of Organic Molecules using Atomic Force Microscopy, Nadine J. van der Heijden, Prokop Hapala, Jeroen A. Rombouts, Joost van der Lit, Daniël Smith, Pingo Mutombo, Martin Švec, Pavel Jelinek, and Ingmar Swart ACS Nano, in press (2016)
  • Recognizing N-dopant atoms in graphene using atomic force microscopy, Nadine J. van der Heijden, Daniël Smith, Gaetano Calogero,Rik S. Koster, Daniel Vanmaekelbergh, Marijn A. van Huis, and Ingmar Swart Physical Review B, 93, 245430 (2016)
  • Mapping the electrostatic force field of single molecules from high-resolution scanning probe images, Prokop Hapala, Martin Švec, Oleksandr Stetsovych, Nadine J. van der Heijden, Martin Ondráček, Joost van der Lit, Pingo Mutombo, Ingmar Swart, and Pavel Jelínek Nature Communications, 7, 11560 (2016)
  • Submolecular Resolution Imaging of Molecules by Atomic Force Microscopy: The Influence of the Electrostatic Force, Joost van der Lit, Francesca Di Cicco, Prokop Hapala, Pavel Jelinek, and Ingmar Swart Physical Review Letters, 116, 096102 (2016)
  • Scanning probe microscopy and spectroscopy of colloidal semiconductor nanocrystals and assembled structures, Ingmar Swart, Peter Liljeroth, and Daniel Vanmaekelbergh Chemical Reviews, 10.1021/acs.chemrev.5b00678 (2016)
  • Modeling the Self-Assembly of Organic Molecules in 2D Molecular Layers with Different Structures, Joost van der Lit, Jolien L. Marsman, Rik S. Koster, Peter H. Jacobse, Stephan A. den Hartog, Daniel Vanmaekelbergh, Robertus J. M. Klein Gebbink, Laura Filion, and Ingmar Swart Journal of Physical Chemistry C, 120, 318 (2016)



  • Intermolecular contrast in atomic force microscopy images without intermolecular bonds. Sampsa K. Hämäläinen, Nadine van der Heijden, Joost van der Lit, Stephan den Hartog, Peter Liljeroth, and Ingmar Swart Physical Review Letters, 113 186102 (2014).
  • Long-range orientation and atomic attachment of nanocrystals in 2D honeycomb superlattices. M.P. Boneschanscher, W. H. Evers, J.J. Geuchies, T. Altantzis, B. Goris, F.T. Rabouw, S.A.P. van Rossum, H.S.J. van der Zant, L.D.A. Siebbeles, G. van Tendeloo, I. Swart, J. Hilhorst, A. V. Petukhov, S. Bals, D. Vanmaekelbergh Science, 344, 1377 (2014).
  • Sample Corrugation Affects the Apparent Bond Lengths in Atomic Force Microscopy. Mark P. Boneschanscher, Sampsa K. Hämäläinen, Peter Liljeroth, Ingmar Swart ACS Nano, 8, 3006 (2014).



  • Quantitative Atomic Resolution Force Imaging on Epitaxial Graphene with Reactive and Non-Reactive AFM Probes, M.P. Boneschanscher, J. van der Lit, Z. Sun, I. Swart, P. Liljeroth, D. Vanmaekelbergh, ACS Nano, 6, 10216 (2012).
  • Controlled Lateral Manipulation of Molecules on Insulating Films by STM, I. Swart, T. Sonnleitner, J. Niedenführ, and J. Repp, Nano Letters, 12, 1070 (2012).


2010 and before